Measurement Standards
Papers
- A Comparison of Material Measurement Accuracy of RF Spot Probes to a Lens-Based Focused Beam System
- A New Method for VHF/UHF Characterization of Anisotropic Dielectric Materials
- A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz
- Spot-Probe Reflectometer Measurements of Geological Core Slab Samples
- Correction of Transmission Line Induced Phase and Amplitude Errors in Reflection and Transmission Measurements
- New Developments in Microwave Materials Measurements
- Extraction of Magneto-Dielectric Properties from Metal-Backed Free-Space Reflectivity
- Ruggedized Compact Microwave Probes for Mapping Material Properties of Structures
- A Microwave Spot Probe Method for Scanning Aircraft Radomes
- New Methods for Improved Accuracy of Broad Band Free Space Dielectric Measurements
- Flat Lens Antenna Technology for Free Space Material Measurements
- R-Coax New Method of Determining Permittivity of Thin Polymer Sheets
- RMMP - New Handheld Sensor measuring Intrinsic Dielectric Properties from 100 to 1000 MHz
Videos
- Epsilometer Principles of Operation
- Epsilometer Demo
- Focused Beam Fundamentals
- Focused Beam Shielding Effectiveness
- Copper Mountain Technologies Integration with our 50 - 110 GHz Focused Beam Materials Measurement System
- Anritsu Vector Star Integration with our 2 GHz & Up Focused Beam Materials Measurement System
- Anritsu Shockline 1 Port Integration with a Cobot and our new SP20-40
- Keysight PNA Integration with our GHz & Up Focused Beam Materials Measurement System
