Expertise

• Electromagnetic materials design and characterization

Education

• PhD Materials Engineering, University of Dayton, 1997
• M.A. Physics, University of Texas, 1990
• B.S Physics, University of Maryland, 1987
• Former Tech Fellow at Georgia Tech Research Institute

Publications

• A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz
• Microwave Material Measurements Without Cables
• Ruggedized Compact Microwave Probes for Mapping Material Properties of Structures
• A comparison of material measurement accuracy of RF spot probes to a lens-based focused beam system
• A New Method for VHF/UHF Characterization of Anisotropic Dielectric Materials
• Computational Analysis of a Permeameter Materials Measurement Fixture
• Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Waveguide
• Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Coaxial Air Line
• Sub-Wavelength Measurement of Electromagnetic Inhomogeneities in Materials
• A Focused-Beam Methodology for Measuring Microwave Backscatter
• Near-Field Probe Measurements of Microwave Scattering from Discontinuities in Planar Surfaces
• Effective Medium Calculations of the Electromagnetic Behavior of Single Walled Carbon Nanotube Composites 
• Numerical Analysis of Transmission Line Techniques for RF Material Measurements
• Numerical Analysis of the Coaxial Airline Fixture for RF Material Measurements
• Correction of Transmission Line Induced Phase and Amplitude Errors in Reflection and Transmission Measurements
• High Dielectric, Filled Polymers for Microwave Applications
• Dielectric Spectroscopy of Polymers
• Anomalous Dispersion in the Dielectric Spectra of Conductive Materials
• JW Schultz, B Simpson, G Reinhard, S Bashore, “Method for Measuring the Effectiveness of Conductive Caulks Used in the Treatment of Gaps and Cracks,” Have Forum Proceedings, San Antonio Texas, July 1999
• Polymerization and Viscoelastic Behavior of Networks from a Dual-Curing, Liquid Crystalline Monomer
• Photopolymerization of Nematic Liquid Crystal Monomers for Structural Applications: Molecular Order and Orientation Dynamics
• Photopolymerization of Nematic Liquid Crystal Monomers for Structural Applications: Linear Viscoelastic Behavior and Cure Effects
• Novel Liquid Crystal Resins for Stereolithography – Mechanical Properties
• Liquid Crystal Network Polymers from Oriented Monomers: Measurement of Molecular Order and Orientation Dynamics with Dielectric Analysis
• Birefringence Thermal Analysis of Liquid Crystalline Monomers and their Photo-Polymers
• JW Schultz, RP Chartoff, “Liquid Crystal Network Polymers from Oriented Monomers: Measurement of Molecular Order and Orientation Dynamics with Dielectric Analysis,” NATAS Notes, 29(3), 20-25, 1997
• JW Schultz, RP Chartoff, "Dielectric and Thermal Analysis of the Film Formation of a Polymer Latex," J. Coatings Technology, 68(861), 97-106, 1996

Focused Beam Methods 

Patents

• Method and Apparatus for Stereolithography - US6117385
• Traveling Wave Spot Probe - US999564
• First Anechoic Chamber - US9459299
• Second Anechoic Chamber - US10048301
• Non-Contact Determination of Coating Thickness - US10203202

Brief Biography

Dr. Schultz is the Chief Scientist at the Compass Technology Group where he leads research and development efforts in RF materials and measurement technology. Previously he was a Technical Fellow at the Georgia Tech Research Institute, where he led programs in experimental and computational research on the electromagnetic properties of materials, structures, and antennas. He has developed materials characterization methodologies via free-space, waveguide, resonant cavity, and impedance analysis instrumentation. He has also modeled electromagnetic composite materials and developed new composite material concepts for novel antenna applications. He has used thermal analysis, microscopy, and analytical techniques to correlate microstructure to macroscopic properties in his research for providing new insight into electromagnetic material characteristics. Dr. Schultz has also developed new techniques for microwave measurement of scatter phenomena and has applied these techniques to materials ranging from composites to camouflage nets. Dr. Schultz’s backscatter methodologies have become an accepted standard method for characterizing diffuse microwave scatter in numerous government and industrial laboratories. In previous positions, he has worked in the areas of novel polymer processing including stereolithography, polymer film formation, and conductive polymers.