This paper introduces a new, non-traditional, method for measuring intrinsic dielectric properties at UHF and VHF frequencies.
Traditional fixtures for UHF and VHF measurements of dielectric properties require specimens cut or machined with precision tolerances to avoid air gap errors. They also require significant handling and multi-step calibration procedures, complicating their use in non-laboratory applications. This paper introduces a new, non-traditional, measurement method for obtaining complex dielectric properties at UHF and VHF frequencies. It applies an open-ended stripline sensor in a handheld device that non-destructively measures reflection from a material surface.
One-Step Calibration Process
A novel computational electromagnetic (CEM) inversion methodology is applied to translate from reflection amplitude and phase into complex permittivity or sheet impedance. Because of this CEM inversion, the calibration is a simple one-step process. The CEM inversion method also enables the characterization of multilayer structures and anisotropic materials. In addition to general principles for the device, example measurements and measurement comparisons to conventional dielectric measurement systems are presented.
