New Methods for Improved Accuracy of Broad Band Free Space Dielectric Measurements

Accurate Characterization of Dielectric Materials

This paper on new methods for improving the accuracy of broad band free space dielectric measurements provides several new corrections that improve the loss tangent accuracy of these methods over an order of magnitude.

Recent interest in communication and sensing at millimeter wave frequencies has led to a need for accurate characterization of dielectric materials for antennas and components. Historically, broad-band free space methods have suffered from poor accuracy when determining the loss tangent of very low-loss materials.

Corrections for Free-Space Probe Measurements

Within this paper corrections that account for beam shift and focusing effects are described and demonstrated on several dielectric materials known for their low loss. These corrections are demonstrated on both focused beam and non-focused, free-space probe measurements.