Intrinsic magnetic and dielectric properties of magneto-dielectric composites are typically determined at microwave frequencies with both transmission and reflection data. An iterative method, such as root-finding, is often used to extract the properties on a frequency-by-frequency basis. In some situations, materials may be manufactured on a metal substrate that prevents transmission data from being obtained. This happens when the materials are too fragile or too strongly bonded to the substrate for removal and must be characterized with the metal substrate in place.
This paper compares two different free-space extraction algorithms, developed for the simultaneous extraction of complex permittivity and permeability from metal-backed reflection. One of the algorithms relies on reflection measurements of the same material with two known thicknesses. The second method takes advantage of wide bandwidth measurements to fit the reflection to analytical models (e.g. Debye). The accuracy of these methods is evaluated and the stability criteria for the techniques will be discussed, as well as the tolerance of the techniques to various measurement errors.
