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Contract RF Materials Measurement

At Compass Technology Group, we utilize our extensive expertise and experience to help customers measure and understand their materials. We understand our equipment better than anyone else in the world and can provide measurement services that customers can rely on. Our team spends time explaining, educating, and guiding our customers based on each client’s needs to ensure understanding of the concepts and technologies involved. We offer contract RF materials measurement in areas such as microwave and millimeter wave, UHF free-space measurements, anechoic absorber testing, and more.

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Benefits of Contracting with Compass Technology Group:

  • Gives you an opportunity to test out the equipment before you make a long-term investment.
  • Our team educates and trains companies on the equipment and measurement results.
  • Provides organizations that do not have the capital or internal expertise with the opportunity to utilize sophisticated equipment for their measurement needs.

Contract Services for RF Material Measurement Systems

Compass Technology Group provides contract services on a variety of RF Materials Measurement Systems:

  • Used for a wide range of materials and structures, the Focused Beam system characterizes intrinsic dielectric and magnetic properties as well as transmission/reflection performance at microwave through millimeter wave frequencies.
  • Additional Information:
    • Dual-Pol frequencies:
      • 2 – 20+ GHz 
      • 20 – 40 GHz
      • 40 – 60 GHz
      • 60 – 90 GHz
    • Sample size approximately 2” to 24” square, depending on lower frequency bound.
    • Data provided: complex permittivity, permeability, sheet. impedance, and/or S-parameters.
    • Shielding effectiveness also available.
  • Used for a wide range of materials and structures, CTG’s UHF free-space system characterizes intrinsic dielectric and magnetic properties as well as transmission/reflection performance.
  • Additional Information:
    • Dual-Pol frequencies from 500 MHz to 5 GHz.
    • Sample size approximately 24” to 48” square, depending on lower frequency bound.
    • Data provided: complex permittivity, permeability, sheet Impedance, and/or S-parameters.
  • Used for an anechoic chamber absorber, the Overhead absorber system characterizes reflectivity performance.
  • Additional Information:
    • Frequencies from 200 MHz up.
    • Default table size is 72”x72”, but larger table is option for improved low frequency accuracy.
    • Data provided: reflection amplitude.
  • Used for dielectric or magnetic materials, the coaxial airline system characterizes complex permittivity and/or permeability.
  • Additional Information:
    • Frequency range: 10 MHz to 18 GHz.
    • Sample size is toroid with 7mm OD and 3.04mm ID.
    • Data provided: Complex Permittivity, Permeability and/or S-parameters.
  • Used for dielectric or magnetic materials, the WR-4200 Waveguide Measurement System characterizes complex permittivity, permeability, and/or sheet impedance.
  • Additional Information:
    • Frequency ranges:
      • 150 – 325 MHz
      • 2.2 – 3.3 GHz
      • 8.2 – 12.4 GHz
    • Sample size is waveguide/frequency band dependent.
    • Data provided: Complex Permittivity, Permeability, Sheet Impedance, and/or S-parameters.
  • Used for a dielectric material, the D2520 resonators characterizes complex permittivity of low-loss materials.
  • Additional Information:
    • Frequency ranges:
      • 2.02, 2.45, and 2.99 GHz (WR-340).
      • 7.97, 10.01, and 12.46 GHz (WR-90).
    • Data provided: complex permittivity.
  • Used for sheet materials, the R-Coax Measurement System characterizes complex permittivity or sheet impedance.
  • Features include:
    • Measurements ranging from 60 MHz to 680 MHz.
    • Sample size: sheets up to 36” width.
    • Data provided: complex sheet impedance.
  • Used for anisotropic or isotropic dielectric materials, the RF Capacitor system characterizes complex permittivity of cube-shaped specimens.
  • Features include:
    • Measurements ranging from 60 MHz to 800 MHz.
    • Three orientations.
    • Sample size: 3″ cubes (30 mil tolerance).
    • Data provided: complex permittivity.
  • Used for dielectric materials, the eMP system characterizes complex permittivity or sheet impedance.
  • Features include:
    • Measurements ranging from 30 MHz to 500 MHz.
    • Sample size: 6”x6” or larger.
    • Data provided: complex permittivity.
  • Used for magneto-dielectric materials, the muMP system characterizes complex magnetic permeability.
  • Features include:
    • Measurements ranging from 60 MHz to 500 MHz.
    • Sample size: 6”x6” or larger.
    • Data provided: complex permeability.
  • Used for dielectric materials, the RMMP system characterizes complex permittivity or sheet impedance.
  • Features include:
    • Measurements ranging from 100 MHz to 1000 MHz.
    • Sample size: 6”x6” or larger.
    • Data provided: complex permittivity or sheet impedance.
  • Used for dielectric materials, the epsilometer system characterizes complex permittivity. 
  • Features include:
    • Measurements ranging from 6 MHz to 6 GHz.
    • Sample size: 0.3 – 3 mm thick x 3”x3” or larger.
    • Data provided: complex permittivity.