Epsilon Measurement Probe (eMP)
The epsilon measurement probe (eMP) is a small, tabletop fixture that measures complex dielectric permittivity of bulk or sheet specimens from 30 MHz to 500 MHz. It consists of a short transmission line terminated in an open circuit. Material specimens are placed onto the small sensor embedded within a larger metal ground plane. CEM inversion then rapidly converts the measured S-parameter data into real and imaginary permittivity.
Applications of the eMP:
- This fixture characterizes materials in a laboratory or manufacturing setting, determining the complex permittivity for material coupons or for monitoring properties of roll-to-roll manufacturing. It can also be used for monitoring time-dependent cure monitoring of materials such as composites or concrete. Examples of how eMP has been used include:
- Measure sheet absorbers such as magnetic absorbers or carbon loaded foams.
- Monitor cure processes in glues and cement.
Benefits of the eMP:
- Electrically small (approximately 2”x2” or 50 x 50 mm) footprint and can be embedded within a metal wall or structure to non-destructively characterize materials as they pass by.
- Relies on CEM inversion to extract material properties from the measured reflection.
- Measures materials non-destructively so that little or no sample preparation is required.
Additional Information:
- Measurement fixture plus an integrated Copper Mountain R60 Vector Reflectometer.
- Includes CTGcalc™ eMP Software (requires computer with Windows 10 or newer):
- Data acquisition and calibration.
- Uses CEM-based method to convert measured S11 into dielectric permittivity or sheet impedance.
- Additional custom data-tables may be developed for different material types (at additional cost).
- Plots measured and inverted data versus frequency, archives data into standard s1p and text formats for easy import into other plotting/analyses applications.
- One year software support and upgrades.
- All comes in a case for easy storage and transportation.
