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UHF Antenna Lens System

Ultra-high frequency (UHF) antenna lens system.

This Ultra High Frequency (UHF) Antenna Lens System combines specially designed metamaterial lenses with linearly polarized wide band antennas to collimate a microwave beam in the 500 to 5 GHz range. The microwave transmission and reflection are measured, including both amplitude and phase, which then determines the intrinsic dielectric and/or magnetic properties of a material specimen.

Applications of the UHF Antenna Lens System:

The UHF Lens System has similar applications to the Microwave Lens System, but the system can test materials at lower frequencies.

Benefits of the UHF Antenna Lens System:

  • Uses a novel metamaterial-based lens to achieve beam collimation with a much smaller and lighter package.
  • Operates down to 500 MHz with 20” (508 mm) lenses.

Additional Information

  • 12’ cart (with wheels and stabilized feet) with mounting hardware/attachments.
  • Two feed antennas:
    • FLAT 500 (500 MHz – 6 GHz).
  • Two Collimating Lenses for the FLAT 500 Antennas (collimates the radiation pattern for improved (smaller spot size, flatter phase taper) illumination of measurement specimens).
  • Lenses constructed from lightweight CTG engineered artificial dielectric metamaterial.
  • Reconfigurable specimen holder (can hold specimens up to 36”x36” (note that minimum specimen size is frequency dependent).
  • Two RF Cables (DC to 11GHz, one 8’ and one 15’).
  • Shipping Crates, installation, and training.

Optional Upgrades

The Bistatic Cart is attached to pivot at the sample position and can be combined with the specimen rotation stage to measure bistatic specular or non-specular scatter from a target or a material.

Benefits of the Bistatic Cart:

  • Enables non-normal angle measurements of specimens.

Additional Information:

  • CTGcalc™ software includes a bistatic tab for aligning the cart and collecting measured bistatic data.
  • Requires the turntable upgrade so that the specimen can also be pivoted.
  • Bistatic Cart upgrades are available for the microwave, millimeter wave, and UHF lens systems.

 

CTGcalc™ provides intuitive capabilities to immediately determine and view measured performance and intrinsic properties of materials.

Benefits of CTGcalc™ Base Software:

  • Acquires S-parameter data and performs calibrations, including time domain gating. 
  • Plots transmission (insertion loss) and/or reflection (reflection loss) versus frequency.
  • Conducts material property inversion algorithms for calculating complex permittivity, permeability, and sheet impedance.

Additional Information:

  • Compatible with most modern Vector Network Analyzers (VNAs) — communicates with network analyzers from Copper Mountain, Keysight, Anritsu, Rhode & Schwartz.
  • Includes CTG’s patented autocal algorithm for correcting RF cable drift errors.
  • One year software support and upgrades.
  • Requires Windows 10 or newer.
  • Visit the CTGcalc™ product page to learn more.

The turntable enables an automated rotation of the specimen to angles other than normal incidence.

Benefits of the Turntable:

  • Allows a series of angle measurements to be made with a click of a button.
  • Adds an azimuth rotation stage under the specimen holder.

Additional Information:

  • A rotation turntable and stepper motor are provided along with the requisite software.
  • Requires CTGcalc™ Software.

Monostatic backscatter performance may be needed for applications such as radar cross section or interference mitigation.

Benefits of the Backscatter:

  • Converts the backscatter amplitude into quantitative scatter, such as scatter-width in dB-meters or radar cross section (RCS) in dB-square meters.

Additional Information:

  • Target mounting fixtures and calibration standards for 2D RCS (infinite cylinder) and/or 3D RCS (spheres) are supplied.
  • Basic inverse synthetic aperture (ISAR) capability is provided to create cross-range and down-range images of scatter.
  • CTGcalc™ software functionality for automating azimuth scans and processing / displaying backscatter data.
  • Requires Turntable upgrade.

The oven or furnace upgrade allows you to take measurements of specimens outside of the ambient temperature. It is supplied with microwave transparent (refractory foam) windows to enable transmission of the RF energy onto the heated specimen.

Benefits of the Oven / Furnace:

  • Oven (up to 425C) or Furnace (over 1000+C) options are available to measure RF material properties versus temperature.
  • Automated oven programming so that a series of ramps and holds can be automatically executed, along with pre-programmed temperatures for measuring the RF properties.

Additional Information:

  • Cart is included for easy insertion of the oven or furnace in between the lenses.
  • Sample mounting hardware and the oven controller are supplied.